JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working This UNIT Instruments UFC-8161 is

This UNIT Instruments UFC-8161 is used working surplus

Inventory # A-13912

This UNIT Instruments 1100-100039 is used working surplus

Model No: H628 WTR V1

Estimated Packed Shipping Dimensions: L x W x H = 12” x 12” x 10” @ 5-6 lbs

JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working This UNIT Instruments UFC-8161 isJEOL Secondary Electron Detector JWS 2000 Wafer Defect Review SEM Working Part No: Secondary Electron Detector Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 3 lbs. Only items