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Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working in resalable condition with all

SKU: 95234394493

4.7
USD1753.62 USD1786.62

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Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 19 - Aug 24

Description

in resalable condition with all original packaging including manuals

For use with the JEOL JSM-6300/6400F SEM Scanning Electron Microscope System This GW Electronics Type 43 Infrared Chamberscope is used working surplus

img{max-width:100%} ASM Vacuum Cylinder Assembly Stainless Steel Epsilon 3000 Wafer Used Working

Inventory # A-10425

Estimated Packed Shipping Dimensions: L x W x H = 20"x20"x20" @ 17 lbs

Nikon 300mm Wafer Inspection Stage Chuck NRM-3100 Overlay Measurement Working in resalable condition with allNikon 300mm Wafer Inspection Stage Chuck NRM 3100 Overlay Measurement Working Model No: Inspection Stage Chuck Removed from a Nikon NRM 3100 300mm Wafer Overlay Measurement System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 25 lbs. Shipping Terms: All Domestic and

Exchange/Return Notes
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  • Final sale items are not eligible for returns or exchanges.
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